Transmission Electron Microscopy in Physics

"Transmission electron microscopy with analytical facilities represents high-resolution experimental method available for the study of the geometry of atom arrangements and the distribution of chemical species in solids. Many research literatures discussing structure-property relation in solids at or near the atomic level are written from the electron microscopy viewpoint because the identification of electronic- and atomic- structures of nanomaterials is essential to understand and control physical properties. The technique of high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) provides an incoherent image of crystals at atomic resolution. The intensity of each atomic column is proportional to their mean square atomic number (Z), thus it allows intuitive location of atom column positions in an image. It is also the only means to obtain atomic resolution electron energy loss spectroscopy. These techniques form a powerful basis for structure determination that provides an initial model for first-principles calculations, which link the atomic and electronic structure of interfaces to macroscopic properties.
The research for the next generation microscope will be also introduced. In future, single atom sensitivity in both imaging and analysis will lead to a new level of insight into the atomic origin of materials properties, the ability to understand the limiting factors in optical/electronic devices and the origin of the unique properties of nanostructured materials.
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